Masashi Watanabe

Publications
  • 2013
    • M. Watanabe: "Practical Processing of Spectrum Images by Multivariate Statistical Analysis: Advantages and Disadvantages", Microsc. Microanal., 19 (2013), Suppl. 2, Cambridge University Press, 2028-2029.
    • M. Watanabe and C.A. Wade: "Practical Measurement of X-ray Detection Performance of a Large Solid-Angle Silicon Drift Detector in an Aberration-Corrected STEM", Microsc. Microanal., 19 (2013), Suppl. 2, Cambridge University Press, 1264-1265
    • C.A. Wade, L. Giannuzzi, A. Herzing, M. McLean, R. Vinci and M. Watanabe: "Investigation of the Embrittlement of Bi Doped Cu Bicrystals by Aberration-Corrected Scanning Transmission Electron Microscopy", Microsc. Microanal., 19 (2013), Suppl. 2, Cambridge University Press, 744-745
    • B. Patel and M. Watanabe: "Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Hard-Soft Composites and Crystalline Materials", Microsc. Microanal., 19 (2013), Suppl. 2, Cambridge University Press, 390-391.
    • B. Patel and M. Watanabe: "Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Nanocomposites", Microsc. Microanal., 19 (2013), Suppl. 2, Cambridge University Press, 362-363.
    • M. Watanabe: "Atomic-resolution Imaging and Analysis by Using the Latest Aberration-corrected STEM", Proc. Australian Microbeam Analysis Society AMAS-XII, Eds. M.R. Phillips, R. Wuhrer and M. Blackford, (2013), Australian Microscopy and Microanalysis Society, 22-23
    • M. Watanabe: "Advanced Materials Characterization by Atomic-resolution Imaging and Spectrometry in Modern Aberration-corrected STEMs", Proc. 30th Annual Conf. Microscopy Soc. Thailand 2013, (2013), Microscopy Society of Thailand, 15-17.
  • 2012
    • M. Watanabe and F.I. Allen A.M. Minor: "Application of the SmartEFTEM-SI method to characterize beam-sensitive materials", Proc. European Microscopy Congress 2012, paper# 911.
    • H. Sawada, M. Watanabe, and I. Chiyo: "Ad hoc auto-tuning of aberrations using atomic-resolution STEM images by autocorrelation function", Proc. European Microscopy Congress 2012, paper# 674
    • B. Patel and M. Watanabe: "Development of a New Specimen Holder for Simultaneous Bright Field and Dark Field STEM-IN-SEM Imaging of Polymer Systems", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, L. Brewer, T. Ruiz & D. Turnquist, 18 (2012), Suppl. 2, Cambridge University Press, 1236-1237.
    • M. Watanabe, A. Yasuhara and E. Okunishi: "Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration-Corrected Scanning Transmission Electron Microscope with a Large Solid-Angle Detector", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, L. Brewer, T. Ruiz & D. Turnquist, 18 (2012), Suppl. 2, Cambridge University Press, 974-975.
    • C.A. Wade, L. Giannuzzi, M. McLean, R. Vinci and M. Watanabe: "Investigation of Grain Boundary Structure and Composition of Bismuth Embrittled Copper Bicrystals with Aberration-Corrected Scanning Transmission Electron Microscopy", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, L. Brewer, T. Ruiz & D. Turnquist, 18 (2012), Suppl. 2, Cambridge University Press, 346-347.
    • H. Sawada and M. Watanabe: "Development of an Ad-Hoc Aberration Auto-tuning Procedure on an Oriented Crystalline Specimen in Aberration-Corrected Scanning Transmission Electron Microscopy: the SIAM Method", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, L. Brewer, T. Ruiz & D. Turnquist, 18 (2012), Suppl. 2, Cambridge University Press, 334-335.
  • 2011
    • M. Watanabe: "Development of various quantitative nanoanalysis methods by high-resolution STEM" (in Japanese), Proc. 55th Symposium of the Japanese Society of Microscopy (2011), Japanese Society of Microscopy, pp. 9-12
    • C.A. Wade and M. Watanabe: "Grain Boundary Structure and Compositional Analysis of Bismuth Doped Copper Bicrystals Using an Aberration Corrected Transmission Electron Microscope", Proc. in 13th Frontiers of Electron Microscopy in Materials Science (2011), p. 93
    • 103. M. Watanabe J. M. Cubero-Sesin, K. Edalati and Z. Horita: "Distribution Measurement of Nanoscale Secondary phases by Newly Developed Rotation Dark-filed Imaging", Proc. in 13th Frontiers of Electron Microscopy in Materials Science (2011), p. 126.
    • M. Watanabe & F.I. Allen, "Development of a new acquisition scheme for energy-filtering transmission electron microscopy spectrum-imaging toward quantification", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, D. Giovannucci, M. Watanabe & D. Susan, 17 (2011), Suppl. 2, Cambridge University Press, 790-791.
    • M. Watanabe, "Applications of thin-film standards in analytical electron microscopy", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, D. Giovannucci, M. Watanabe & D. Susan, 17 (2011), Suppl. 2, Cambridge University Press, 862-863.
    • M. Watanabe, J. Cubero, K. Edalati & Z. Horita, "Development of rotation dark-field imaging for mapping secondary-phase distributions in nano-scale", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, D. Giovannucci, M. Watanabe & D. Susan, 17 (2011), Suppl. 2, Cambridge University Press, 1104-1105.
    • H. Sawada, M. Watanabe, E. Okunishi & Y. Kondo: "Auto-tuning of aberrations using high-resolution STEM images by auto-correlation function", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, D. Giovannucci, M. Watanabe & D. Susan, 17 (2011), Suppl. 2, Cambridge University Press, 1308-1309.
  • 2010
    • M. Watanabe, "Atomic-level characterization of grain-boundary segregation and elemental site-location in Ni-base superalloy by aberration-corrected scanning transmission electron microscopy", Proc. 7th Inter. Sympo. Superalloy 710 and Derivatives, Eds. E.A. Ott, J.A. Groh, A. Banik, I. Dempster, T.P. Gabb, R. Helmink, X. Liu, A. Mitchell, G.P. Sjöberg & A. Wusatowska-Sarnek, The Materials, Metals, & Materials Society (2010), 719-723.
    • M. Watanabe, E. Okunishi & T. Aoki, "Toward atomic-level X-ray analysis in aberration-corrected scanning transmission electron microscopy", Proc. 17th Inter. Microscopy Cong., Eds. G. Solórzano and W. de Souza, Sociedade Brasileira de Microscopia e Microanálise (2010), 270-271.
    • M. Watanabe, M. Kanno and E. Okunishi, "Atomic-resolution elementak mapping by EELS and XEDS in aberration corrected STEM", JEOL News, 45 (2010), 8-15.
    • F.I. Allen, M. Watanabe, N.P. Balsara & A.M. Minor, "Chemical Mapping of Block Copolymer Electrolytes by EFTEM Spectrum Imaging", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, J. Mansfield, B. Foran, J. Frafjord, D. Beniac and D. O'Neil, 16 (2010), Suppl. 2, Cambridge University Press, 1762-1763.
    • Wu Zhou, Elizabeth I. Ross-Medgaarden, Kevin F. Doura, Masashi Watanabe, Israel E. Wachs & Christopher J. Kiely, "Revealing Structure-Activity Relationships in Model Double-Supported WO3/TiO2/SiO2 Solid Acid Catalysts by Atomic Scale Characterization", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, J. Mansfield, B. Foran, J. Frafjord, D. Beniac and D. O'Neil, 16 (2010), Suppl. 2, Cambridge University Press, 1446-1447.
    • M. Watanabe, "XUtils Ver. 1: A Set of Gatan DigitalMicrograph Plug-ins for Characterization of XEDS-detector Performance Parameters in an AEM", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, J. Mansfield, B. Foran, J. Frafjord, D. Beniac and D. O'Neil, 16 (2010), Suppl. 2, Cambridge University Press, 260-261.
    • M. Watanabe, E. Okunishi & T. Aoki, "Atomic-Level Chemical Analysis by EELS and XEDS in Aberration-Corrected Scanning Transmission Electron Microscopy", Microsc. Microanal., Eds. J.D. Shields, S. McKernan, J. Mansfield, B. Foran, J. Frafjord, D. Beniac and D. O'Neil, 16 (2010), Suppl. 2, Cambridge University Press, 66-67.
    • Jong Min Yuk, Kwanpyo Kim, Zonghoon Lee, Masashi Watanabe, A. Zettl, Tae Whan Kim, Young Soo No, Won Kook Choi and Jeong Yong Lee: "Metal Zn Nanocrystal Fabrication on ZnO Films by Thermally Assisted Electromigration in Transmission Electron Microscopy", MRS2010, Spring.
    • F.I. Allen, M. Watanabe, N.P. Balsara and A.M. Minor: "Chemical Mapping of Block Copolymer Electrolytes by Energy Filtered Spectrum Imaging in a TEM", MRS2010 Spring.
  • 2009
    • M. Watanabe: "Atomic-resolution chemical analysis by electron energy-loss spectrometry and X-ray energy dispersive spectrometry in aberration-corrected electron microscopy", Proc. on Atomic Level Characterization for New Materials and Devices '09 (ALC09), The 141st Committee on Microbeam Analysis, Japan Society for the Promotion of Science, (2009) pp. 400-405.
    • M. Watanabe, E. Okunishi and K. Ishizuka: "Analysis of Spectrum-Imaging Datasets in Atomic-Resolution Electron Microscopy", Microscopy and Analysis, 23(2009), Issue 7, 5-7.
    • M. Watanabe: "X-ray Analysis in Aberration-corrected Scanning Transmission Electron Microscopes for Atomic-column X-ray Imaging", MRS2009 Fall.
    • M. Watanabe, "Improvement of elemental analysis sensitivity by spectrum imaging and multivariate statistical analysis and their applications for atomic-column analysis" , Japan Microscopy Society Fall Symposium
      • (2009) (in Japanese), pp. 11-14.
    • J.M. Yuk, K. Kim, Z.L. Lee, M. Watanabe, A. Zettl, J.Y. Lee, Y.S. No, T.W. Kim & W.K. Choi, "In-situ TEM observation of metal Zn nanocrystal growth on ZiO films", Microsc. Microanal., Eds. L.N. Brewer, S. McKernan, J.D. Shields, F.E. Schmidt, Jr., J.H. Woodward and N.J. Zaluzec, 15 (2009), Suppl. 2, Cambridge University Press, 698-699.
    • M. Varela, A.R. Lupini, M.P. Oxley, W. Luo, M. Watanabe, J.T. Luck, M.D. Biegalski, H.M. Christen, M. Murfitt, N. Dellby, O. Krivanek, S.T. Pantelides & S.J. Pennycook, "Atomic resolution mapping of inequivalent O sites in complex oxides", Microsc. Microanal., Eds. L.N. Brewer, S. McKernan, J.D. Shields, F.E. Schmidt, Jr., J.H. Woodward and N.J. Zaluzec, 15 (2009), Suppl. 2, Cambridge University Press, 434-435.
    • A.L. Koh, M. Watanabe, C.M. Shachaf, G.P. Nolan & R. Sinclair, "Electron energy loss spectrometry (EELS) and energy-filtered TEM (EFTEM) analyses of composite organic-inorganic nanoparticles (COINs)", Microsc. Microanal., Eds. L.N. Brewer, S. McKernan, J.D. Shields, F.E. Schmidt, Jr., J.H. Woodward and N.J. Zaluzec, 15 (2009), Suppl. 2, Cambridge University Press, 432-433.
    • M.D. Rossell, M. Watanabe, R. Erni, V. Radmilovic & U. Dahmen, "Quantitative Li mapping in Al alloys by sub-eV resolution energy-filtering transmission electron microscopy (EFTEM) in the aberration-corrected, monochromated TEAM0.5 instrument", Microsc. Microanal., Eds. L.N. Brewer, S. McKernan, J.D. Shields, F.E. Schmidt, Jr., J.H. Woodward and N.J. Zaluzec, 15 (2009), Suppl. 2, Cambridge University Press, 430-431.
    • M. Varela, M.P. Oxley, W. Luo, J. Tao, M. Watanabe, A.R. Lupini, S.T. Pantelides & S.J. Pennycook, "Atomic resolution spectroscopic imaging of complex oxide materials", EDGE2009, p.126.
    • V.J. Keast, M.J. Gladys, T.C. Petersen, G. Kothleitner, C. Dwyer & M. Watanabe, "Using electron phase shifts to detect plasmon resonances of gold nanospheres", EDGE2009, p.15.
    • M. Watanabe, M.D. Rossell, R. Erni, V. Radmilovic & U. Dahmen, "Applications of high spatial/energy resolution energy-filtering transmission electron microscopy (HREFTEM) for phase analysis of Al alloys in the aberration-corrected, monochromated TEAM instrument", EDGE2009, p.66.
    • S.J. Shin, J. Guzman, C.W. Yuan, C.Y. Liao, P.R. Stone, O.D. Dubon, A.M. Minor, M. Watanabe, J.W. Ager III, D.C. Chrzan & E.E. Haller, "Structural characterization of GeSn alloy nanocrystals embedded in SiO2", MRS2009Spring.
  • 2008
    • Z. Lee, A. Dato, R. Erni, W.-K. Hsieh, M. Watanabe, M. Frenklach & V. Radmilovic, "High resolution imaging and spectroscopy of graphene using the TEAM 0.5", Proc. in The 9th Asia-Pacific Microscopy Conference Proceeding (APMC9), Jeju, Korea (2008), 45-47.
    • U. Dahmen, R. Erni, C. Kisielowki, V. Radmilovic, Q. Ramasse, A. Schmid, T. Duden, M. Watanabe, A. Minor & P. Denes, "An update on the TEAM project - first results from the TEAM 0.5 microscope, and its future development", EMC 2008 14th European Microscopy Congress, Eds. by M. Luysberg, K. Tillmann & T. Weirich, Springer Berlin Heidelberg (2008), 3-4.
    • V. Srot, M. Watanabe, C. Scheu, P.A. van Aken, J. Janek & M. Rühle, "Analytical TEM investigations of Pt/YSZ interfaces", EMC 2008 14th European Microscopy Congress, Eds. by M. Luysberg, K. Tillmann & T. Weirich, Springer Berlin Heidelberg (2008), 369-370.
    • M. Watanabe, M. Kanno, D.W. Ackland, C.J. Kiely & D.B. Williams, "Optimization of acquisition parameters for atomic-column electron energy-loss spectrum imaging in a JEM-2200FS aberration-corrected scanning transmission electron microscope", Microsc. Microanal., Eds. M. Makko, S. McKernan, J. Shields, J.H. Scott, P. Kotula, I. Anderson & J. Woodward, 14 (2008), Suppl. 2, Cambridge University Press, 1400-1401.
    • M. Watanabe, "Atomic-column electron energy-loss spectrum imaging in aberration-corrected STEM", Proc. 20th Australian Conf. Microsc. Microanal. and 4th Congress of Inter. Union Microbeam Analysis Soc., Ed. By B.J. Griffin, Australian Microscopy and Microanalysis Society Inc., (2008), 230-231.
    • M. Watanabe, "Developments and applications of new quantitative X-ray analysis/mapping", Proc. 20th Australian Conf. Microsc. Microanal. and 4th Congress of Inter. Union Microbeam Analysis Soc., Ed. By B.J. Griffin, Australian Microscopy and Microanalysis Society Inc., (2008), 69-70.
  • 2007
    • M. Watanabe, "Recent progress of quantitative X-ray analysis of thin-film specimens in transmission electron microscopy", MRS2007 Fall.
    • M. Watanabe, "Atomic-level characterization of materials by aberration-corrected scanning transmission electron microscopes", Atomic Level Characterization for New Materials and Devices f07 (ALC07).
    • D.B. Williams & M. Watanabe, "Progress of X-ray analysis in transmission electron microscopes from1977 to 2007 and toward the future", in Proc. 9th Inter-American Congress of Electron Microscopy (IACEM), (2007).
    • M. Watanabe & D.B. Williams, "Electron energy-loss and X-ray spectrum imaging for materials characterization in aberration-corrected scanning transmission electron microscopes", Proc. in 11th Frontiers of Electron Microscopy in Materials Science (FEMMS), (2007).
    • D.B. Williams, D.W. Ackland & M. Watanabe, "Quantification of X-ray spectrum images in the analytical electron microscope: progress toward single-atom-detection limits", Microsc. Microanal., Eds. M. Makko, J.H. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, S. McKernan & J. Shields, 13 (2007), Suppl. 2, Cambridge University Press, 1348-1349.
    • M. Watanabe, M. Kanno, D.W. Ackland, C.J. Kiely & D.B. Williams, "Applications of electron energy-loss spectrometry and energy filtering in an aberration-corrected JEM-2200FS STEM/TEM", Microsc. Microanal., Eds. M. Makko, J.H. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, S. McKernan & J. Shields, 13 (2007), Suppl. 2, Cambridge University Press, 1264-1265.
    • M. Watanabe, H. Hojo, D.W. Ackland, C.J. Kiely & D.B. Williams, "Applications of aberration-corrected scanning transmission electron microscopy for atomic-scale characterization", Microsc. Microanal., Eds. M. Makko, J.H. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, S. McKernan & J. Shields, 13 (2007), Suppl. 2, Cambridge University Press, 1198-1199.
    • M. Watanabe & D.B. Williams, "Development of diffraction imaging for orientation analysis of grains in scanning transmission electron microscopy", Microsc. Microanal., Eds. M. Makko, J.H. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, S. McKernan & J. Shields, 13 (2007), Suppl. 2, Cambridge University Press, 962-963.
    • C.J. Kiely, A.A. Herzing, M. Watanabe, J.K. Edwards, D.I. Enache, A.F. Carley & G.J. Hutchings, "Aberration corrected analytical electron microscopy of supported bimetallic catalysts", Microsc. Microanal., Eds. M. Makko, J.H. Scott, E. Vicenzi, S. Dekanich, J. Frafjord, P. Kotula, S. McKernan & J. Shields, 13 (2007), Suppl. 2, Cambridge University Press, 864-865.
  • 2006
    • T. Yaguchi, Y. Kuroda, M. Konno , T. Kamino & M. Watanabe, "New specimen preparation method for 3D structural and elemental analyses", Proc. 16th Inter. Microscopy Cong., Eds. H. Ichinose & T. Sasaki, Publication Committee of IMC16 (2006), 1075.
    • V. Srot, C. Scheu, M. Watanabe, E. Tchernychova, W. Sigle, H. Fischer & M. Rühle, "EELS and EDX study of Pt/YSZ interfaces", Proc. 16th Inter. Microscopy Cong., Eds. H. Ichinose & T. Sasaki, Publication Committee of IMC16 (2006), 1321.
    • D.W. Saxey, R.K. Zheng, M. Watanabe, D.B. Williams & S.P. Ringer, "Nanostructural Analysis of Ni-based Superalloys by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy", Proc. 16th Inter. Microscopy Cong., Eds. H. Ichinose & T. Sasaki, Publication Committee of IMC16 (2006), 802.
    • M. Watanabe, D.W. Ackland C.J. Kiely, D.B. Williams, M. Kanno, R. Hynes & H. Sawada, "Optimization of a spherical-aberration-corrected scanning transmission electron microscope for atomic-resolution annular dark-field imaging and electron energy-loss spectrometry", Proc. 16th Inter. Microscopy Cong., Eds. H. Ichinose & T. Sasaki, Publication Committee of IMC16 (2006), 606.
    • M. Watanabe & D.B. Williams, "Progress on X-ray analysis of materials in spherical-aberration corrected scanning transmission electron microscopes", Proc. 16th Inter. Microscopy Cong., Eds. H. Ichinose & T. Sasaki, Publication Committee of IMC16 (2006), 869.
    • S.R. Claves & M. Watanabe, "Spectrum imaging analysis of secondary phases in aluminum alloy 6063", Microsc. Microanal., Eds. P. Kotula, M. Makko, J.H. Scott, R. Gauvin, D. Beniac, G. Lucas, S. McKernan & J. Shields, 12 (2006), Suppl. 2, Cambridge University Press, 1410-1411.
    • D.B. Williams & M. Watanabe, "Atomic-scale characterization of metals and alloys using spherical-aberration corrected scanning transmission electron microscopy", Microsc. Microanal., Eds. P. Kotula, M. Makko, J.H. Scott, R. Gauvin, D. Beniac, G. Lucas, S. McKernan & J. Shields, 12 (2006), Suppl. 2, Cambridge University Press, 1344-1345.
    • M. Watanabe, D. Saxey, R.K. Zheng, D.B. Williams & S.P. Ringer, "Characterization of Ni-base superalloys on the atomic scale by atom probe tomography and spherical-aberration corrected analytical electron microscopy techniques", Microsc. Microanal., Eds. P. Kotula, M. Makko, J.H. Scott, R. Gauvin, D. Beniac, G. Lucas, S. McKernan & J. Shields, 12 (2006), Suppl. 2, Cambridge University Press,, Cambridge University Press, 534-535.
    • T. Yaguchi, Y. Kuroda, M. Konno, T. Kamino, K. Kaji & M. Watanabe, "A method for 3 dimensional structural and compositional imaging of nano-materials", Microsc. Microanal., Eds. P. Kotula, M. Makko, J.H. Scott, R. Gauvin, D. Beniac, G. Lucas, S. McKernan & J. Shields, 12 (2006), Suppl. 2, Cambridge University Press, 528-529.
    • M. Watanabe, M.G. Burke & D.B. Williams, "Progress of elemental/compositional mapping via X-rays and energy-loss electrons in analytical electron microscopes", Microsc. Microanal., Eds. P. Kotula, M. Makko, J.H. Scott, R. Gauvin, D. Beniac, G. Lucas, S. McKernan & J. Shields, 12 (2006), Suppl. 2, Cambridge University Press, 142-143.
    • M. Watanabe, D.W. Ackland, C.J. Kiely, D.B. Williams, M. Kanno, R. Hynes & H. Sawada, "The aberration corrected JEOL JEM-2200FS FEG-STEM/TEM fitted with an W electron energy-filter: performance characterization and selected applications", JEOL News, 41 (2006), 1-6.
  • 2005
    • D.B. Williams & M. Watanabe, "Quantitative X-ray analysis of materials by spherical-aberration corrected analytical electron microscopes", Atomic Level Characterization for New Materials and Devicesf05 (ALC05), The Microbeam Analysis 141 Committee of Japan Society for the Promotion of Science, (2005), 554-557.
    • M.G. Burke, M. Watanabe & D.B. Williams, "Quantitative characterization of nanoprecipitates in irradiated low alloy steels: advances in the application of FEG-STEM quantitative analysis to real materials", Proc. 10th Frontiers of Electron Microscopy in Materials Science (FEMMS), (2005).
    • M. Watanabe & D.B. Williams, "Frontiers of X-ray analysis in analytical electron microscopy: toward atomic-scale resolution and single-atom sensitivity", Proc. 10th Frontiers of Electron Microscopy in Materials Science (FEMMS), (2005).
    • M. Watanabe, D.W. Ackland, A. Burrows, C.J. Kiely, D.B. Williams, M. Kanno & R. Hynes, "Advantages of Cs-correctors for spectrometry in STEM", Microsc. Microanal., Eds. R. Price, P. Kotula, M. Makko, J.H. Scott, G.F. Vander Voort, E. Manilova, M. Mah Lee Ng, K. Smith, B. Griffin, P. Smith & S. McKernan, 11 (2005), Suppl. 2, Cambridge University Press, 2132-2133.
    • A.A. Herzing, M. Watanabe, C.J. Kiely, B.E. Solsona, J. Edwards, P. Landon, A.F. Carley & G.J. Hutchings, "Microstructural investigations of high productivity Au-Pd catalysts for the synthesis of hydrogen peroxide via direct combination of H2 and O2", Microsc. Microanal., Eds. R. Price, P. Kotula, M. Makko, J.H. Scott, G.F. Vander Voort, E. Manilova, M. Mah Lee Ng, K. Smith, B. Griffin, P. Smith & S. McKernan, 11 (2005), Suppl. 2, Cambridge University Press, 1568-1569.
    • M. Watanabe & D.B. Williams, "X-ray analysis in the AEM with angstrom-level spatial resolution and single-atom detection", Microsc. Microanal., Eds. R. Price, P. Kotula, M. Makko, J.H. Scott, G.F. Vander Voort, E. Manilova, M. Mah Lee Ng, K. Smith, B. Griffin, P. Smith & S. McKernan, 11 (2005), Suppl. 2, Cambridge University Press, 1362-1363.
    • T. Yaguchi, M. Konno, T. Kamino, K. Kaji, T. Ohnishi & M. Watanabe, "3D composition imaging using a dedicated FIB/STEM system", Microsc. Microanal., Eds. R. Price, P. Kotula, M. Makko, J.H. Scott, G.F. Vander Voort, E. Manilova, M. Mah Lee Ng, K. Smith, B. Griffin, P. Smith & S. McKernan, 11 (2005), Suppl. 2, Cambridge University Press, 630-361.
    • C.J. Kiely, M. Watanabe, A. Burrows, P. Clasen, M.P. Harmer, B. Rodríguez-González, L. Marzán, I. Hussain, J. Fink & M. Brust, "What are the limitations in the characterization of self-assembled metamaterials using advanced microscopy techniques?", Microsc. Microanal., Eds. R. Price, P. Kotula, M. Makko, J.H. Scott, G.F. Vander Voort, E. Manilova, M. Mah Lee Ng, K. Smith, B. Griffin, P. Smith & S. McKernan, 11 (2005), Suppl. 2, Cambridge University Press, 204-205.
    • M. Watanabe & D.B. Williams, "STEM-XEDS Spectrum-imaging composition determination of nanoscale particles surrounded by matrix/support materials", in Proc. 9th Conf. EMAS/3rd Conf. IUMAS, (2005), 363.
    • M. Watanabe, A. Burrows, D.W. Ackland, C.J. Kiely & D.B. Williams, "Improved nanoscale imaging and microanalysis of materials using spherical-aberration corrected scanning transmission electron microscopes", in Proc. 9th Conf. EMAS/3rd Conf. IUMAS, (2005), 362.
  • 2004
    • M. Watanabe & D.B. Williams, "Improvements of elemental mapping via X-ray spectrum imaging combined with principal component analysis and zero-peak deconvolution", in Microsc. Microanal., Eds. I.M. Anderson, R. Price, E. Hall, E. Clark & S. McKernan, 10 (2004), Suppl. 2, Cambridge University Press, 1040-1041.
    • T. Yaguchi, M. Konno, T. Kamino, T. Hashimoto, T. Ohnishi & M. Watanabe, "3D elemental mapping using a dedicated FIB/STEM system", Microsc. Microanal., Eds. I.M. Anderson, R. Price, E. Hall, E. Clark & S. McKernan, 10, (2004), Suppl. 2, Cambridge University Press, 1030-1031.
    • M. Watanabe, A. Burrows, A.A. Herzing, C.J. Kiely, D.B. Williams, G. Hutchings & L.M. Liz-Marzan, "High resolution X-ray elemental mapping of nanoparticles in the STEM", Microsc. Microanal., Eds. I.M. Anderson, R. Price, E. Hall, E. Clark & S. McKernan, 10 (2004), Suppl. 2, Cambridge University Press, 468-469.
    • L.F. Allard, D.A. Blom, M.A. OfKeefe, C.J. Kiely, D.W. Ackland, M. Watanabe, M. Kawasaski, T. Kaneyama & H. Sawada, "First results from the aberration-corrected JEOL 2200FS-AC STEM/TEM", Microsc. Microanal., Eds. I.M. Anderson, R. Price, E. Hall, E. Clark & S. McKernan, 10 (2004), Suppl. 2, Cambridge University Press, 110-111.
  • 2003
    • M. Watanabe & D.B. Williams, "Quantitative X-ray nanoanalysis and mapping in the AEM" in Proc. in 9th Frontiers of Electron Microscopy in Materials Science (FEMMS), (2003).
    • D.B. Williams & M. Watanabe, "Quantitative microanalysis and elemental imaging in the AEM: a tutorial", Atomic Level Characterization for New Materials and Devices f03 (ALC03). (2003).
    • M. Watanabe & D.B. Williams, "Accurate determination of grain boundary coverages of segregating elements by STEM X-ray mapping combined with the z-factor method", Microsc. Microanal., Eds. D. Piston, J. Bruley, I.M. Anderson, P. Kotula, G. Solorzano, A. Lockley & S. McKernan, 9 (2003), Suppl. 2, Cambridge University Press, 668-669.
    • M. Watanabe & D.B. Williams, "Improvements to energy resolution of an X-ray energy dispersive spectrum by deconvolution using the zero strobe peak", Microsc. Microanal., Eds. D. Piston, J. Bruley, I.M. Anderson, P. Kotula, G. Solorzano, A. Lockley & S. McKernan, 9 (2003), Suppl. 2, Cambridge University Press, 124-125.
    • D.B. Williams & M. Watanabe, "Effects of sample preparation in analysis: spectroscopy", Microsc. Microanal., Eds. D. Piston, J. Bruley, I.M. Anderson, P. Kotula, G. Solorzano, A. Lockley & S. McKernan, 9 (2003), Suppl. 2, Cambridge University Press, 104-105.
  • 2002
    • M. Watanabe & D.B. Williams, "Application of principal component analysis in STEM-XEDS spectrum-imaging", Microbeam Analysis Society Workshop in Hyperspectrum (2002).
    • D.B. Williams, M. Watanabe & M.G. Burke, "Quantitative microanalysis with high spatial resolution: application of FEG-STEM XEDS microanalysis to the characterization of complex microstructures in irradiated low-alloy steel", in Proc. 3rd Int. Sympo. Atomic Level Characterization for New Materials and Devices f01 (ALC01), The Microbeam Analysis 141 Committee of Japan Society for the Promotion of Science, (2002), 133-137.
    • C. Li, M. Watanabe, J. Li, D.W. Ackland & D.B. Williams, "Sb grain boundary segregation in rapidly solidified Cu-Sb alloy", Microsc. Microanal., Eds. E. Voelkl, D. Piston, R. Gauvin, A.J. Lockley, G.W. Bailey & S. McKernan, 8 (2002), Suppl. 2, Cambridge University Press, 1598-1599.
    • M. Watanabe, D.B. Williams & Y. Tomokiyo, "Comparison of detection limits for elemental mapping by EF-TEM and STEM-XEDS", Microsc. Microanal., Eds. E. Voelkl, D. Piston, R. Gauvin, A.J. Lockley, G.W. Bailey & S. McKernan, 8 (2002), Suppl. 2, Cambridge University Press, 1588-1589.
    • M.G. Burke, M. Watanabe & D.B. Williams, "Irradiation-induced development of nanoscale features in steel: complementary 3D-APFIM and FEG-STEM characterization", Microsc. Microanal., Eds. E. Voelkl, D. Piston, R. Gauvin, A.J. Lockley, G.W. Bailey & S. McKernan, 8 (2002), Suppl. 2, Cambridge University Press, 292-293.
  • 2001
    • M. Watanabe & D.B. Williams, "Future direction of high-resolution X-ray microanalysis in the AEM", Microsc. Microanal., Eds. G.W. Bailey, R.L. Price, E. Voelkl & I.H. Musselman, 7 (2001), Suppl. 2, Springer-Verlag, 212-213.
  • 2000
    • S.-H. Mun, X. Li, M. Watanabe, D.B. Williams, K.H. Oh & H.-C. Lee, "Precipitation of austenite particles at grain boundaries during aging of Fe-Mn-Ni steel", in Proc. of Int. Conf. on 7th APEM, Singapore(2000)
    • A.J. Papworth, M. Watanabe & D.B. Williams, "The Determination of carbide types in thin-film specimens of low alloy steels", Microsc. Microanal., Eds. G.W. Bailey, S. McKernan, R.L. Price, S.D. Walck, P.-M. Charest & R. Gauvin, 6 (2000), Suppl. 2, Springer-Verlag, 348-349.
    • D.B. Williams & M. Watanabe, "X-ray microanalysis in the STEM", Microsc. Microanal., Eds. G.W. Bailey, S. McKernan, R.L. Price, S.D. Walck, P.-M. Charest & R. Gauvin, 6 (2000), Suppl. 2, Springer-Verlag, 112-113.
    • Z. Akase, Y. Tanaka, Y. Tomokiyo & M. Watanabe, "Measurement of local oxygen concentration in YBa2Cu3Oy by convergent-beam electron diffraction", in Advances in Superconductivity XII, Eds. T. Yamashita & K. Tanabe, Springer-Verlag, (2000), 200-202.
    • Y. Tomokiyo, Z. Akase & M. Watanabe, "Observation of pinning centers and detection of local fluctuation of oxygen concentration in Y-Ba-Cu-O by transmission electron microscopy", in Proc. 2000 International Workshop on Superconductivity, (2000), 155-158.
    • M. Watanabe & D.B. Williams, "Theoretical simulation of probe sizes for microanalysis in AEM", in Proc. 2nd Conf. IUMAS, Eds. D.B. Williams & R. Shimizu, Institute of Physics, (2000), 155-156.
    • T. Fujita, M. Watanabe & Z. Horita, "Modification of z-factor method for quantitative X-ray microanalysis in analytical electron microscopy", in Proc. 2nd Conf. IUMAS, Eds. D.B. Williams & R. Shimizu, Institute of Physics, (2000), 141-142.
  • 1999
    • D.B. Williams & M. Watanabe, "High resolution X-ray microanalysis in the transmission electron microscope", in Proc. X Conference on Electron Microscopy of Solids, Eds. E. Jerzierska & J.A. Kozubowski, Jagiellonian University, Warsaw, Poland, (1999), 109-116.
    • M. Watanabe & D.B. Williams, "The new form of the z-factor method for quantitative microanalysis in AEM-XEDS and its evaluation", Microsc. Microanal., Eds. G.W. Bailey, W.G. Jerome, S. McKernan, J.F. Mansfield & R.L. Price, 5 (1999), Suppl. 2, Springer-Verlag, 88-89.
    • Z. Horita & M. Watanabe, "Chemical composition analysis for interfaces by analytical electron microscopy", in Surface and Near-Surface Analysis of Materials, Eds. P. Vinvenzini & S. Veleri, Techna, (1999), 71-82.
  • 1998
    • Z. Horita, M. Watanabe & M. Nemoto, "Energy dispersive X-ray microanalysis in analytical electron microscopy" in Proc. Asian Science Seminar New Direction in Transmission Electron Microscopy and Nano-Characterization of Materials, Eds. C. Kinoshita, Y. Tomokiyo & S. Matsumura, Kyushu University Press, (1998), 209-221.
    • D.B. Williams, V.J. Keast, M. Watanabe & D.T. Carpenter, "Segregation to interfaces in materials and alloys", in Proc. 14th Int. Cong. Electron Microscopy, Eds. H.A.C. Benavides & M.J. Yacaman, II (1998), 27-28.
    • M. Watanabe, D.T. Carpenter, D.W. Ackland & D.B. Williams, "The z-factor approach for quantitative composition and thickness ,mapping in AEM-XEDS", in Proc. 14th Int. Cong. Electron Microscopy, Eds. H.A.C. Benavides & M.J. Yacaman, III (1998), 565-566.
    • M. Watanabe & D.B. Williams, "Quantitative composition and thickness mapping with high spatial resolution by XEDS in a 300kV FEG-AEM", Microsc. Microanal., Eds. G.W. Bailey, K.B. Alexander, W.G. Jerome, M.G. Bond & J.J. McCarthy, 4 (1998), Suppl. 2, Springer-Verlag, 136-137.
    • D.T. Carpenter, M. Watanabe, K. Barmak, D.B. Williams & D.A. Smith, "Measurement of Cu distribution in an Al-4wt.%Cu thin film by analytical electron microscopy", in Boundaries & Interfaces in Materials: The David A. Smith Symposium, Eds. R.C. Pond, W.A.T. Clark, A.H. King & D.B. Williams, The Minerals, Metals & Materials Society, (1998), 199-204.
  • 1997
    • D.B. Williams, M. Watanabe, D.T. Carpenter, V.J. Keast & Y. Ito, "Nanometer-scale microanalysis of interfaces in thin films", in Proc. Int. Symp. Atomic Level Characterization for New Materials and Devices f97, The Microbeam Analysis 141 Committee of Japan Society for the Promotion of Science, (1997), pp. 66-71.
    • M. Watanabe, D.T. Carpenter, K. Barmak & D.B. Williams, "Quantitative X-ray mapping with high resolution", in Proc. Electron Microscopy and Analysis 1997, Ed. J.M. Rodenburg, Institute of Physics, (1997), pp.295-298.
    • G. Lucadamo, M. Watanabe, K. Barmak & D.B. Williams, "High resolution X-ray microanalysis of Nb/Al multilayer thin film", Microsc. Microanal., Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 3 (1997), Suppl. 2, Springer-Verlag, 967- 968.
    • M. Watanabe, D.W. Ackland & D.B. Williams, "Practical estimation of analytical sensitivity for EDS in an intermediate voltage FEG-STEM", Microsc. Microanal., Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 3 (1997), Suppl. 2, Springer-Verlag, 965-966.
    • D.T. Carpenter, M. Watanabe, K. Barmak, D.B. Williams & D.A. Smith, "Quantification of Cu segregation to grain boundaries in an Al-4wt.%Cu thin film using high resolution X-ray mapping", Microsc. Microanal., Eds. G.W. Bailey, R.V.W. Dimlich, K.B. Alexander, J.J. McCarthy & T.P. Pretlow, 3 (1997), Suppl. 2, Springer-Verlag, 537-538.
  • 1996
    • T. Ootoshi, N. Komai, K. Fujiwara, M. Watanabe, Z. Horita & M. Nemoto, "Orientation relationship in Ni/Ni3X (X = Al, Si, Ga, Ge) diffusion-couple interfaces", in Proc. JIMIS-8 Interface Science and Materials Interconnection, The Japan Institute of Metals, (1996) 427-430.
    • M. Watanabe, Z. Horita & M. Nemoto, "Quantitative X-ray microanalyis and thickness determination using z factor" in Proc. 54th Annual Meeting of EMSA, 30th Annual Meeting of MAS and 23rd Annual Meeting of MSC, Eds. G.W. Bailey, J.M. Corbett, R.V.W. Dimlich, J.R. Michael & N.J. Zaluzec, San Francisco Press, (1996), 580-581.
  • 1994
    • M. Watanabe, Z. Horita & M. Nemoto, "Application of analytical electron microscopy to determination of mass absorption coefficient for low energy X-ray lines", in Proc. 13th Int. Cong. Electron Microscopy, Eds. B. Jouffrey & C. Colliex, 1, Les Editions de Physique, (1994), 605-606.
    • M. Watanabe, Z. Horita, D.J. Smith, M.R. McCartney, T. Sano & M. Nemoto, "Interfacial structure and composition in Ni/Ni3Al diffusion couples", in Proc. 3rd IUMRS Int. Conf. Advanced Materials, Eds. M. Sakai, M. Kobayashi, T. Suga, R. Watanabe & Y. Ishida, Vol. 16B, Elsevier, (1994), 1429-1432.
  • 1992
    • M. Watanabe, Z. Horita, D.J. Smith, M.R. McCartney, T. Sano & M. Nemoto, "Study of Ni/Ni3Al diffusion-couple interface by analytical electron microscopy and high resolution electron microscopy", in Proc. 50th Annual Meeting of EMSA, 27th Annual Meeting of MAS and 19th Annual Meeting of MSC, Eds. G.W. Bailey, J. Bentley & J.A. Small, San Francisco Press, San Francisco, CA, (1992), 54-55.
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