Masashi Watanabe's Home Page - Profile: Invited talks

Thank you very much for invitation!

2013
Annual meeting of Microscopy & Microanalysis 2013, "Practical Processing of Spectrum Images by Multivariate Statistical Analysis: Advantages and Disadvantages", Invited tutorial talk, Aug./6/乫13, Indianapolis, IN.
Workshop of Advances in Scanning Transmission Electron Microscopy, "The SIAM Method: an Ad-Hoc Aberration Auto-tuning Procedure on a Crystalline Specimen in Aberration-corrected STEM", Aug./3/乫13, Townsend, TN.
Canadian Centre for Electron Microscopy Summer School 2013, "Atomic-level Elemental Imaging by Spectrometry in Aberration-Corrected STEM and Data Processing", McMaster University, Hamilton, ON, Canada, June/27/'13.
North Carolina State University, "Nanocharacterization of Materials Using the Latest Aberration-corrected STEM", Mar./15/乫13, Raleigh, NC.
Florida State University TEM Symposium, "Atomic-resolution Imaging and Analysis in the Latest Aberration-corrected STEM", Feb./20/乫13, Tallahassee, FL.
Australian Microbeam Analysis Society AMAS-XII meeting, "Atomic-resolution Imaging and Analysis by Using the Latest Aberration-corrected STEM", Feb./6/'13, Sydney Australia.
Australian Microbeam Analysis Society AMAS-XII workshop of Advanced TEM, "Analytical Electron Microscopy and Data Processing", Feb./5/'13, Sydney Australia.
Australian Microbeam Analysis Society AMAS-XII workshop of Advanced TEM, "Aberration correction for STEM", Feb./5/'13, Sydney Australia.
30th Microscopy Society of Thailand annual meeting, "Advanced Materials Characterization by Atomic-resolution Imaging and Spectrometry in Modern Aberration-corrected STEMs", Jan./24/乫13, Chanthaburi, Thailand.
Arizona State University Winter School for Electron Microscopy, "X-ray Energy Dispersive Spectrometry and Nanoanalysis", Jan./9/'13, Tempe, AZ

2012

5th SuperSTEM Summer School on Aberration-Corrected STEM, "Atomic-level Elemental Imaging by Spectrometry in Aberration-Corrected STEM and Data Processing", Sep./15/'12, Manchester, UK.
Annual meeting of Microscopy & Microanalysis 2012, "Quantitative Analysis of Atomic-Resolution X-ray Maps in an Aberration- Corrected Scanning Transmission Electron Microscope with a Large Solid- Angle Detector", July/31/'12, Phoenix, AZ.
Max-Planck Institute für Intelligente Systeme, StEM Workshop at Ringberg, "Atomic resolution Chemical Analysis toward Quantification and STEM Autotuning", July/12/'12, Ringberg, Germany.
Max-Planck Institute für Intelligente Systeme Kolloquium, "Materials Characterization at Atomic Scale Using the Latest Aberration-corrected Scanning Transmission Electron Microscopes", July/9/'12, Stuttgart, Germany.
Midwest Microscopy and Microanalysis Society workshop "Seeing is Believing: Aberration Corrected STEM", "Atomic-resolution spectrometry in the latest aberration-corrected STEM", Apr./26/'12, Chicago, IL.
141st annual TMS spring meeting, "Characterization of chemistry of nanomaterials by (scanning) transmission electron microscopy", Mar./15/'12, Orlando, FL.
Arizona State University Winter School for Electron Microscopy, "X-ray Energy Dispersive Spectrometry and Nanoanalysis", Jan./6/'12, Tempe, AZ

2011

Annual Meeting of Materials Science & Technology 2011, "SmartEFTEM-SI: A New Acquisition Procedure for Quantitative Elemental Imaging by Energy-Filtering TEM", Oct./19/'11, Columbus, OH.
JEOL Ltd., "Microscopy Hacks! - Automated Data Acquisition for Quantification and Visualization" (in Japanese), Oct./5/'11, Tokyo, Japan.
55th Fall Symposium of the Japanese Microscopy Society, the Seto award invited seminar "Development of various quantitative nanoanalysis methods by high-resolution STEM" (in Japanese), Sep./30/'11, Takamatsu, Japan
The University of Tokyo, "Atomic-resolution Spectrometry using Aberration-corrected STEMs in Combination with Multivariate Statistical Analysis" (in Japanese), Sep./29/'11, Tokyo, Japan
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, "Frontiers of X-ray Analysis in Scanning Transmission Electron Microscopes", Sep./15/'11, Berkeley, CA.
XX International Materials Research Congress, "Atomic-resolution EELS and XEDS Imaging in Aberration-corrected Analytical Electron Microscopes", Aug./15/'11, Cancun, Mexico.
Kyushu University, "Atomic-level Materials Characterization by Aberration-corrected Scanning Transmission Electron Microscopy and Multivariate Statistical Analysis" (in Japanese), July/12/'11, Fukuoka, Japan.
Toyota Center of R&D Institute, "Atomic-level Materials Characterization by Aberration-corrected Scanning Transmission Electron Microscopy" (in Japanese), July./6/'11, Aichi, Japan.
Rutgers University, "Atomic-resolution Chemical Analysis in Aberration-corrected Analytical Electron Microscopy", Apr./21/'11, Pistakaway, NJ.
Arizona State University Winter School for Electron Microscopy, "X-ray Energy Dispersive Spectrometry and Nanoanalysis", Jan./12/'11, Tempe, AZ.

2010

Annual Meeting of Materials Science & Technology 2010, "Atomic-resolution Chemical Analysis by Aberration-corrected Scanning Transmission Electron Microscopy with Multivariate Statistical Analysis", Oct./19/'10, Houston, TX.
7th International Symposium on Superalloy 718 and Derivatives, "Atomic-Level Characterization of Grain-Boundary Segregation and Elemental Site-Location in Ni-Base Superalloy by Aberration-Corrected Scanning Transmission Electron Microscopy", Oct./13/'10, Pittsburg, PA.
JEOL Ltd., "Transmission Electron Microscopy for Materials Characterization and its Future" (in Japanese), Oct./7/'11, Tokyo, Japan.
17th International Microscopy Congress, "Progress on X-ray Analysis of Materials in Aberration-Corrected Scanning Transmission Electron Microscopes", Sep./22/'10, Rio de Janeiro, Brazil.
Annual meeting of Microscopy & Microanalysis 2010, "Atomic-Level Chemical Analysis by EELS and XEDS in Aberration-Corrected Scanning Transmission Electron Microscopy", Aug./4/'10, Portland, OR.
Max-Planck-Institute für Eisenforschung GmbH, "Atomic-resolution Chemical Analysis and Nano-order Grain-orientation Analysis in Scanning Transmission Electron Microscopy", July/12/'10, Düsseldorf, Germany
Max-Planck-Institute für Metallforschung, "Atomic-resolution Chemical Analysis in Aberration-corrected Scanning Transmission Electron Microscopy", July/5/'10, Stuttgart, Germany
Ernst Ruska-Centrum für Mikroskopie und Spektroskopie mit Elektronen, Institut für Mikrostrukturforschung Forschungszentrum Jülich, "Atomic-level Characterization of Elemental Distributions in Materials by Aberration-corrected STEM", July/1/'10, Jülich, Germany
Graz University of Technology, "Atomic-resolution Chemical Analysis in Aberration-corrected STEM", June/30/'10, Graz, Austria
Canadian Centre for Electron Microscopy Summer School 2010, "Energy Dispersive X-ray Spectrometry: from Basics to Applications in Aberration-Corrected STEM", June/3/'10, McMaster University, Hamilton, ON, Canada
ASM International Eastern NY Chapter Spring Symposium, "Probing Atomic-level Chemical Distribution in Aberration-corrected Scanning Transmission Electron Microscopy", May/18/'10, Niskayuna, NY
University of Wisconsin, Department of Materials Science & Engineering, "Atomic-resolution EELS and XEDS imaging in Aberration-corrected Scanning Transmission Electron Microscopy", Mar./25/'10, Madison, WI
Workshop of Imaging in Electron Microscopy II, University of South Carolina, Industrial Mathematics Institute & Nano Center, "Efficient Processing of Large Scale Spectrum-imaging Datasets by Multivariate Statistical Analysis", Feb./18/'10, Columbia, SC
Arizona State University Winter School for Electron Microscopy, "X-ray Energy Dispersive Spectrometry and Nanoanalysis", Jan./13/'10, Tempe, AZ.

2009

7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09, "Atomic-resolution chemical analysis by electron energy-loss spectrometry and X-ray energy dispersive spectrometry in aberration-corrected electron microscopy", Dec./10/'09, Maui, HI
Materials Research Society 2009 fall meeting, "X-ray analysis in aberration-corrected scanning transmission electron microscopes for atomic-column X-ray imaging", Dec./1/'09, Boston, MA
JEOL Ltd., "Improvement of analytical sensitivity by spectrum-imaging and multivariate statistical analysis", Nov./5/'09, Tokyo, Japan (in Japanese)
Annual meeting of the Japanese Microscopy Society, "Improvement of elemental analysis sensitivity by spectrum imaging and multivariate statistical analysis and their applications for atomic-column analysis", Nov./1/'09, Tokyo, Japan (in Japanese)
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, "EFTEM/STEM Spectrum Imaging Workshop at NCEM" (invited workshop instructor), Aug./13, 14/'09, Berkeley, CA.
Annual meeting of Microscopy & Microanalysis 2009, "Quantitative Li Mapping in Al alloys by Sub-eV Resolution EFTEM in the Aberration-Corrected, Monochromated TEAM0.5 " (for Marta Rossell), July/29/'09, Richmond, VA.
University of South Carolina, Industrial Mathematics Institute/Nano Center, "Applications of multivariate statistical analysis for large-scale spectrum-image datasets and atomic-resolution images", Mar./3/'09, Columbia, SC.
Arizona State University Winter School for Electron Microscopy, "X-ray Energy Dispersive Spectrometry and Nanoanalysis", Jan./8/'09, Tempe, AZ.

2008

Workshop on New Possibilities with aberration corrected electron microscopy at the Royal Society, "X-ray Analysis in Aberration-corrected Analytical Electron Microscopy: Towards Atomic-column XEDS Imaging", Nov./24/'08, London, UK.
University of California Santa Cruz, Department of Chemistry & Biochemistry, "Atomic-level Chemical Analysis in Aberration-Corrected (Scanning) Transmission Electron Microscopes", Nov./5/'08, Santa Cruz, CA.
Center for Nanophase Materials Sciences-SHaRE User Week at Oak Ridge National Laboratory, "Application of Advanced Spectrum-Imaging for Nano-Feature Characterization in Materials", Sep./24/'08, Oak Ridge, TN.
Workshop on Aberration-Corrected Microscopy and Spectroscopy for Materials at Oak Ridge National Laboratory, "Improvements of Nano-Characterization Based on Spectrometry Approaches in Aberration-Corrected Instruments", Sep./23/'08, Oak Ridge, TN.
Kazato Award Lecture, "Developments of Atomic-Scale Characterization and Quantitative Analysis Methods of Materials in Scanning Transmission Electron Microscopy", 64th Annual Meeting of Japanese Microscopy Society, May/21/'08, Kyoto, Japan (in Japanese).
Lehigh University, "Fundamental Crystallography: Basic Concepts of Crystals, Lattices and Space Groups for Crystal Drawing", Mar./19/'08, Bethlehem, PA.
Lehigh University, "Developments of Quantitative Analysis and Characterization Methods for Materials Science in Scanning Transmission Electron Microscopy", Mar./18/'08, Bethlehem, PA.
20th Australian Conference on Microscopy & Microanalysis/4th Congress on International Union of Microbeam Analysis Society, "Atomic-Column Electron Energy-Loss Spectrum Imaging in Aberration-Corrected STEM", Feb./13/'08, Perth, Australia.
20th Australian Conference on Microscopy & Microanalysis/4th Congress on International Union of Microbeam Analysis Society, "Improvements of X-ray Analysis of Thin-Films in Aberration-Corrected Scanning Transmission Electron Microscopes", Feb./11/'08, Perth, Australia.
20th Australian Conference on Microscopy & Microanalysis, Pre-meeting workshop X-ray Mapping, "X-ray Mapping of Thin Films in Scanning Transmission Electron Microscopy", Feb./9/'08, Perth, Australia.
Arizona State University Winter School for Electron Microscopy, "X-ray Energy Dispersive Spectrometry and Nanoanalysis", Jan./10/'08, Tempe, AZ.

2007

Technical University of Denmark, Center for Electron Nanoscopy, "Toward Atomic Resolution Analysis using Aberration-Corrected Scanning Transmission Electron Nanoscopes", Dec./06/'07, Kgs Lyngby, Denmark.
Materials Research Society 2007 fall meeting, "Recent progress of Quantitative X-ray Analysis of Thin-Film Specimens in Transmission Electron Microscopy", Nov./28/'07, Boston, MA.
6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07, "Atomic-Level Characterization of Materials by Aberration-Corrected Scanning Transmission Electron Microscopes", Nov./02/'07, Kanazawa, Japan.
11th Frontiers of Electron Microscopy in Materials Science, "Electron Energy-Loss and X-ray Spectrum Imaging for Materials Characterization in Aberration-Corrected Scanning Transmission Electron Microscopes", Sep./28/'07, Sonoma, CA.
Annual meeting of Microscopy & Microanalysis 2007, "Applications of Electron Energy-Loss Spectrometry and Energy Filtering in an Aberration-Corrected JEM-2200FS STEM/TEM", Aug./9/'07, Fort Lauderdale, FL.
Annual meeting of Microscopy & Microanalysis 2007, "Applications of Aberration-Corrected Scanning Transmission Electron Microscopy for Atomic-Scale Characterization", Aug./8/'07, Fort Lauderdale, FL.

2006

Oak Ridge National Laboratory, "High Spatial Resolution Chemical Analysis of Materials Using Aberration-Corrected Scanning Transmission Electron Microscopes", Nov./14/'06, Oak Ridge, TN.
Lawrence Berkeley National Laboratory, "Recent Progress on X-ray Analysis for Materials Characterization in Aberration-Corrected Scanning Transmission Electron Microscopes", Sep./28/'06, Berkeley, CA.
Hitachi Hightechnologies ltd., "Advantages in Materials Characterization via Modern Analytical Electron Microscopes", Sep./14/'06, Hitachinaka, Ibaraki, Japan.
JEOL Ltd., "Advanced Materials Characterization by Aberration-Corrected Analytical Electron Microscopes", Sep./13/'06, Akishima, Tokyo, Japan.
16th International Microscopy Congress, "Progress on X-ray Analysis of Materials in Aberration-Corrected Scanning Transmission Electron Microscopes", Sep./5/'06, Sapporo, Japan.
Annual meeting of Microscopy & Microanalysis 2006, "Progress of Elemental/Compositional Mapping via X-rays and Energy-Loss Electrons in Analytical Electron Microscopes", Aug./2/'06, Chicago, IL.
SuperSTEM Summer School 2006, "Advantage of X-ray analysis in aberration-corrected analytical electron microscopes ", June/25/'06, Daresbury, UK
Graz University of Technology, "Atomic-Level Characterization of Materials by X-Ray Analysis in Analytical Electron Microscopes", June/20/'06, Graz, Austria

2005

Max-Planck-Institute für Metallforschung, "Atomic level characterization in Conventional and Spherical Aberration-Corrected Analytical electron microscopes", Oct./24/'05, Stuttgart, Germany
Graduiertenkolleg "Innere Grenzflächen, "Materials Characterization via X-ray Analysis in Analytical Electron Microscope", Oct./12/'05, Irsee, Germany
10th Frontiers of Electron Microscopy in Materials Science, "Frontiers of X-ray Analysis in Analytical Electron Microscopy: Toward Atomic-Scale Resolution and Single-Atom Sensitivity", Sep./27/'05, Kasteel Vaalsbroek, Netherlands
Annual meeting of Microscopy & Microanalysis 2005, "Advantages of Cs-correctors for Spectrometry in STEM", Aug./2/'05, Honolulu, HI
Naval Research Laboratory, "Application of Focused Ion Beam for Specimen Preparation for TEM", July/15/'05, Washington, DC
Solid-Solid Phase Transformations in Inorganic Materials 2005, "Atomic-Level Analytical Electron Microscopy of Diffusional Phase Transformations", May/31/'05, Phoenix, AZ
Scanning 2005, "Current State of X-ray Mapping/Spectrum-Imaging in Conventional and Cs-Corrected Analytical STEMs: Toward Atomic Scale Resolution", Apr./7/'05, Monterey CA
Center for Advanced Materials and Nanotechnology Forum, "Advantages of Cs-correctors for STEM Spectrometry", Mar./2/'05, Bethlehem, PA
AMAS VIII - The Eight Biennial Symposium, "Improvements in Quantitative STEM-XEDS Mapping by Principal Component Analysis and z-Factor Methods", Feb./16/'05, Melbourne, Australia

2004

Max-Planck-Institute für Metallforschung, "Multivariate Statistical Analysis of Spectrum Profiling and Imaging", Nov./22/'04, Stuttgart, Germany
Max-Planck-Institute für Metallforschung, "An Introduction of Quantitative X-ray Micro(Nano)analysis in Analytical Electron Microscopes", Nov./15/'04, Stuttgart, Germany
20th AEM Workshop, "Current Progress in Analytical Electron Microscopy", Aug./31/'04, Chiba, Japan (in Japanese)
Annual meeting of Microscopy & Microanalysis 2004, "High Resolution X-Ray Elemental Mapping of Nanoparticles in the STEM", Aug./3/'04, Savannah, GA
Materials Research Society 2004 spring meeting, "Characterization of Elemental Segregation in Alloys by Quantitative STEM X-ray Mapping and TEM Orientation Imaging", Apr./14/'04, Sun Francisco, CA

2003

Sandia National Laboratory, "Quantitative Microanalysis of Boundary Segregation and Fine Precipitates in Materials by Analytical STEM"", Oct./12/'03, Livemore, CA
9th Frontiers of Electron Microscopy in Materials Science, "Quantitative X-Ray Nanoanalysis and Mapping in the AEM", Oct./6/'03, Berkley, CA
Annual meeting of Microscopy & Microanalysis 2003, "Accurate Determination of Grain Boundary Coverages of Segregating Elements by STEM X-ray Mapping Combined with the z-factor Method", Aug./5/'03, San Antonio, TX
Microbeam Analysis Society Workshop on Spectrum-Imaging and Hyperspectral Data Analysis 2003, "Application of Principal Component Analysis in STEM-XEDS Spectrum-Imaging", Apr./30/'03, NIST, Gaithersburg, MD

2002

Annual meeting of the Japanese Society of Electron Microscopy, "Future Direction of Quantitative X-ray Mapping in Analytical Electron Microscopy", Nov./11/'02, Sendai, Japan (in Japanese)

2000

Annual meeting of the Japanese Society of Surface Analysis, "Evaluation of Spatial Resolution for Microanalysis in the Analytical Electron Microscope", Oct./15/'00, Shiga, Japan (in Japanese)
16th AEM Workshop, "Application of quantitative X-ray Mapping for Measurements of Boundary Segregation", Sep./1/'00, Tokyo, Japan (in Japanese)
Annual meeting of the Japanese Society of Electron Microscopy, "Quantitative X-ray Microanalysis in Analytical Electron Microscopy", May/20/'00, Tokyo, Japan (in Japanese)

1999

15th AEM Workshop, "Comparison of Elemental Mapping Techniques: XEDS mapping vs. EELS mapping", Sep./4/'99, Tokyo, Japan 1999 (in Japanese)

1998

14th AEM Workshop, "Quantitative X-ray Mapping in Analytical Electron Microscopes", Sep./1/'98, Tokyo, Japan (in Japanese)
14th International Congress on Electron Microscopy, "The z-Factor Approach for Quantitative Composition and Thickness Mapping in AEM-XEDS", Sep./2/'98, Cancun, Mexico