- Java Electron Crystallography Package
- Process Diffraction
- J.L. Lábár, "Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part I: Principles", Microsc. Microanal. 14 (2008), 287-295.
- J.L Lábár, "Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part II: Implementation", Microsc. Microanal. 15 (2009), 20-29.
- J.L. Lábár, "Consistent indexing of a (set of) SAED pattern(s) with the ProcessDiffraction program", Ultramicrosc., 103 (2005) 237-249.
- XVis
A program for simulation and analysis of electron diffraction patterns
Author: Xingzhong Li
Platform: Windows
Citation: X.Z. Li, "JECP/PCED - A Computer Program for Simulation of Polycrystalline Electron Diffraction Pattern and Phase Identification", Ultramicrosc., 99 (2004) 257-261.
Link: http://www.unl.edu/CMRAcfem/XZLI/programs.htm
A program for analysis of selected area diffraction patterns
Author: János Lábár
Platform: Windows
Citations:
A program describes the dawn of reciprocal space building and geometrical explanation of diffraction
Authors: O. Yefanov
Platform: Windows
Citation: O. Yefanov, V. Kladko, M. Slobodyan, Y. Polischuk, "XVis: An Educational Open-source Program for Demonstration of Reciprocal-space Construction and Diffraction Principles", J. Appl. Cryst., 41, (2008), 647-652.
Link: http://x-ray.net.ua/xvis.html