Surface Roughness: SPM, AFM, and more....

 

<a href="http://clipper.lehigh.edu/engr1/vid/surfruf_smi.rpm"></a>

 

This video provides a short overview of the methods available in measuring surface roughness. Prof. Rick Vinci from the department of Materials Science and Engineering as well as Mr. N. Barbosa give us a tour of their Laboratory in Whitaker building which is located in our main Lehigh campus.

Please scroll down for a comprehensive list of methods

video runtime is 6 minutes
   

Content was designed and prepared by Rick Vinci and Nicholas Barbosa, both of whom appear in the video. Taping and editing was done by Steven Lichak of Lehigh University Media Productions. Coordination was provided by Jacob Kazakia. Bill Mitchell facilitated the streaming and Robin Deily designed the web presentation.

Some images and an animated segment shown in the video are taken with NanoScope® SPM, courtesy Digital Instruments, Veeco Metrology Group, Santa Barbara ,CA, www.di.com
We acknowledge the financial support of Lehigh University's Clipper Project and that of the Mellon Foundation

 

Scanning Probe Microscopy (SPM)

Atomic Force Microscopy (AFM)

Contact Mode AFM
Tapping Mode AFM

A few other forms of SPM

Magnetic Force Microscopy (MFM)
Chemical Force Microscopy (CFM)
Scanning Tunneling Microscopy (STM)
Scanning Thermal Microscopy (SThM)
Scanning Capacitance Microscopy (SCM)
Lateral Force Microscopy (LFM)

 

Jacob Y. Kazakia © 2001 All rights reserved